Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
TED · 456632-2026cn-standardCloses in 53 days · 2026-08-24
Value
Estimated€2,523,546 · 28,000,000 SEK
Awarded—
Who already wins at this buyer
Firms with recorded awards from Lunds universitet in this tender’s CPV categories — the incumbents you are bidding against.
| Firm | Wins | Awarded | Last win |
|---|---|---|---|
| AIXTRON Ltd. | 3 | €8,534,459 | 2026-06-29 |
| Xvivo Perfusion AB | 1 | €372,069 | 2026-05-07 |
| CHROMATOTEC | Norsk Analyse AB | 1 | €363,526 | 2026-04-30 |
| Sartorius Lab Instruments GmbH & Co. KG | 1 | €279,884 | 2026-06-29 |
| LIGHT CONVERSION, UAB | 1 | €205,396 | 2026-06-29 |
Full buyer profile: what Lunds universitet buys and who wins it →
CPV codes
38511100 Laboratory, optical & precision equipment38000000 Laboratory, optical & precision equipmentDescription
Lund Nano Lab (LNL) at Lund University intends to purchase a Focused Ion Beam Scanning Electron Microscope, in this document referred to as the FIB-SEM, instrument or equipment. This document lists all the requirements the FIB-SEM must meet. The instrument is intended to be used for high-resolution imaging, materials analysis and preparing samples for TEM analysis as well as for experiments at the MAX IV synchrotron.
Similar tenders
Closest by meaning — across languages, via embeddings.
| Published | Title | Buyer | Match |
|---|---|---|---|
| 2026-05-29 | Focused Ion Beam Scanning Electron Microscope | Technische Universiteit Delft NL | 94% |
| 2026-06-12 | Scanning Electron Microscope (SEM) | Högskolan i Borås SE | 91% |
| 2026-06-04 | WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM | — BE | 91% |
| 2026-04-30 | Supply, Delivery and Installation of a Transmission Electron Microscopy (TEM) Suite consisting of 2 TEM tools and 1 Focused Ion Beam–Scanning Electron Microscope (FIB.SEM) for Tyndall Instit, UCC, | University College Cork IE | 90% |
| 2026-06-18 | Maintenance and repair of electron microprobe and microscopes for the examination of highly radioactive samples | European Commission, DG JRC - Joint Research Centre DE | 90% |
| 2026-06-26 | Scanning Electron Microscope | Danmarks Tekniske Universitet - DTU DK | 89% |
Records162,040 tendersNewest notice2026-07-03Last ingest2026-07-03 · TED daily 06:00Parser health (7d)all runs clean